Abstract
The University of Central Florida invention describes a method to create functional defects in 2D materials with the ability to control their dimensions and composition. The invention uses a nanoscale tip, such as the tip of an atomic force microscopy cantilever, and light to manipulate the environment (humidity, gas, solvent, temperature, force applied, and wavenumber) directly beneath the tip for defect creation. This approach can be used to pattern arrays of nanoscale defects of selected compositions in 2D materials, with the ability to control the size and chemistry of the defects without high heat or other high-energy processes (such as plasma or high-power lasers).
Partnering Opportunity
The research team is seeking partners for licensing and/or research collaboration.
Stage of Development
Prototype available.
Benefit
Takes less than 60 seconds to form each defectEnables the creation of adjacent structures with variable nanoscale dimensions and various compositionCustom patterns can be produced, including arrays and free-form defectsMarket Application
Quantum emittersMore advanced quantum platformsSensors, including quantum sensorsPlasmonic structuresEngineered 2D catalystsNanopores for biological applications such as for genome sequencing
Brochure
